Dopant distributions in rare-earth-doped alumina
- Lehigh Univ., Bethlehem, PA (United States)
- Univ. of Chicago, IL (United States)
The distribution of yttrium and lanthanum dopants has been mapped in yttrium- and lanthanum-doped polycrystalline aluminas using imaging secondary-ion mass spectrometry (imaging-SIMS). Both dopants segregate to grain boundaries and pore surfaces. On average, yttrium occupies 7.1%--9.0% of the available grain-boundary cation sites, whereas lanthanum occupies only 2.0%--5.2%. In 1,000-ppm-yttrium-doped alumina, an abundance of yttrium aluminum garnet precipitates also is observed. Implications of these observations to the creep behavior of alumina are discussed. The similarity in the segregation behavior of yttrium and lanthanum highlights the potential of lanthanum-doped alumina for improved creep properties.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 483661
- Journal Information:
- Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Journal Issue: 2 Vol. 80; ISSN 0002-7820; ISSN JACTAW
- Country of Publication:
- United States
- Language:
- English
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