THE EXOELECTRONIC EMISSION METHOD FOR INVESTIGATING TRAPPING LEVELS IN CRYSTAL PHOSPHORS AND ITS APPLICATION TO THE STUDY OF TRAPPING LEVELS IN CaS, SrS PHOSPHORS
Journal Article
·
· Optics and Spectroscopy (U.S.S.R.) (English Translation)
OSTI ID:4829968
An apparatus was designed to study the trapping levels of crystal phosphors by means of exoelectron emission in high vacuum. A substantial difference was found in phosphors of the CaS and SrS type between exoelectronic emission and glow curves: low temperature peaks did not occur on exoemission curves; high temperature peaks did not generally have corresponding peaks on glow curves. The properties of exoelectron emission curves were related to the surface nature of this emission. (auth)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-16-019515
- OSTI ID:
- 4829968
- Journal Information:
- Optics and Spectroscopy (U.S.S.R.) (English Translation), Journal Name: Optics and Spectroscopy (U.S.S.R.) (English Translation) Vol. Vol: 2
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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