SEMICONDUCTOR-SPECTROMETERS FOR CHARGED PARTICLES

Journal Article · Sun Oct 01 04:00:00 EDT 1961 · Izvest. Akad. Nauk. S.S.S.R., Ser. Fiz.

OSTI ID:4811684

Zubritskii, L A; Popov, A I; Sorokin, P V; Samoilov, V F

According to recent publications, semiconductor devices used as spectrometers yield better results in the study of charged particies than scintillation spectrometers or ionization chambers. The space charge under inverse transition voltage represents the sensing element. Several Ge and Si semiconductor spectrometers were examined, making use of Po/sup 210/ alpha - particles for testing the spectroscopic properties of the detectors. The Au-Ge type spectrometers used at liquid N temperature showed lmproved resolution when the voltage was lncreased to 5 v; beyond 30 v the resolution became worse. Spectrometers using Si had a resolution of 3% in the range of 5 to 10 v; beyond that the noise level affected the resolution. At higher voltages the change from 50 to 180 v resulted in only a 2.5% change in the resolution. The effective wwidth of the sensitive layer was also determined. The maxlmum energy of the scattered protons was 2.2 Mev. (TTT)

• Research Organization: Khar'kov State Univ.
• NSA Number: NSA-16-004349
• OSTI ID: 4811684
• Journal Information: Izvest. Akad. Nauk. S.S.S.R., Ser. Fiz., Journal Name: Izvest. Akad. Nauk. S.S.S.R., Ser. Fiz. Vol. Vol: 25
• Country of Publication: Country unknown/Code not available
• Language: Russian

Related Subjects

ALPHA PARTICLES
CHARGED PARTICLES
ELECTRIC CHARGES
ENGINEERING AND EQUIPMENT
GERMANIUM
LIQUIDS
NITROGEN
POLONIUM 210
PROTONS
RESOLUTION
SCATTERING
SEMICONDUCTORS
SENSITIVITY
SILICON
SPECTROMETERS
TEMPERATURE