Versatile semiconductor beta spectrometer

Journal Article · Tue Jan 01 04:00:00 EST 1974 · Nucl. Instrum. Methods, v. 115, no. 2, pp. 413-418

DOI:https://doi.org/10.1016/0029-554X(74)90240-7· OSTI ID:4310917

Fellmann, S; Patt, B

A spectrometer using semiconductor counters has been developed. It was designed for the investigation of short-lived radionuclides with complex BETA - spectra, the determination of relative abundances and shape factors, the measurement of conversion coefficients and ratios as well as different types of angular correlations ( BETA gamma , gamma e/sup -/, BETA e/sup -/). In preliminary measurements the te mperature dependence of the energy resolution for electrons was investigated for several Si(Li)-detectors in the temperature range from ambient temperature to --180 deg C. With regard to electron angular correlation investigations, careful anisotropy measurements of the experimental equipment were carried out, yielding for the experimental anisotropy A = (0.1 plus or minus 0.2)%. Finally, comprehensive investigations due to backscattering of the electrons out of semiconductor counters were performed. These results are confirmed by corresponding measurements in conjunction with a magnetic Siegbahn-Slaetis intermediate image spectrometer. (auth)

• Research Organization: Univ., Marburg, Ger.
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-024319
• OSTI ID: 4310917
• Journal Information: Nucl. Instrum. Methods, v. 115, no. 2, pp. 413-418, Journal Name: Nucl. Instrum. Methods, v. 115, no. 2, pp. 413-418; ISSN NUIMA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

*BETA SPECTROMETERS-- LI-DRIFTED SI DETECTORS
*LI-DRIFTED SI DETECTORS-- PERFORMANCE
ANGULAR CORRELATION
ENERGY RESOLUTION
LOW TEMPERATURE
N46130* --Instrumentation--Radiation Detection Instruments-- Nuclear Spectroscopic Instrumentation
TEMPERATURE DEPENDENCE