ISOTOPIC ABUNDANCE DETERMINATION OF COPPER BY SPUTTERING
Journal Article
·
· Journal of Applied Physics (U.S.)
A spectrometer is described, in which an energy-resolved Cs ion beam sputters a Cu target at an incident energy of 0.3 to 3 kev. The sputtered Cu ions are then accelerated into a second part of the spectrometer, in which the Cu/ sup 63/ and Cu/sup 65/ components are separated completely. The completeness of this separation indicates that the energy spread of the sputtered ions is less than 10 ev. The Cu/sup 63//Cu/sup 65/ isotopic ratio is found by this method to be 2.25 plus or minus 0.02. (T.F.H.)
- Research Organization:
- General Electric Co., Schenectady, N.Y.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-16-033606
- OSTI ID:
- 4803403
- Journal Information:
- Journal of Applied Physics (U.S.), Journal Name: Journal of Applied Physics (U.S.) Vol. Vol: 33; ISSN JAPIA
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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