Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

STUDIES ON INDUCED VARIATION IN THE RHIZOBIA. II. RADIATION SENSITIVITY AND INDUCTION OF ANTIBIOTIC-RESISTANCE MARKERS

Journal Article · · Applied Microbiology (U.S.) Changed to Appl. Environ. Microbiol.ed as Arch. Pathol. (March 1928-September 1950 and July 1960-December 1975) and as AMA
OSTI ID:4802878
The relation between survival and dose of ultraviolet (uv) light or x rays was, with only one exception, nonlinear for late-log-phase cultures of four species of Rhizobium. The LD/sub 90/ for different bacterial strains ranged from 400to 3,000 ergs per mm/sup 2/ for uv treatment, and from 3.0 to 7.5 kr for x-ray treatment. Minor existing differences in response to some antibacterial compounds (disc tests) were usable as secondary markers for genetic experiments. Spontaneous and radiationinduced mutants, resistant to high levels of several antibiotics, notably dihydrostreptomycin and erythromycin, were isolated for primary marker purposes. A significant phenotypic lag for mutation to dihydrostreptomycin resistance was noted for uv-irradiated cells. The uv-induced frequency exceeded the x-ray-induced frequency by a factor of at least three, at a comparable level of lethality. No significant change in the symbiotic capability was observed in rhizobial strains marked with antibiotics resistance. (auth)
Research Organization:
Brookhaven National Lab., Upton, N.Y.
NSA Number:
NSA-16-007427
OSTI ID:
4802878
Report Number(s):
BNL-5107; 0003-6919
Journal Information:
Applied Microbiology (U.S.) Changed to Appl. Environ. Microbiol.ed as Arch. Pathol. (March 1928-September 1950 and July 1960-December 1975) and as AMA, Journal Name: Applied Microbiology (U.S.) Changed to Appl. Environ. Microbiol.ed as Arch. Pathol. (March 1928-September 1950 and July 1960-December 1975) and as AMA Vol. Vol: 9; ISSN APMBA
Country of Publication:
United States
Language:
English