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Calorimetric study of the energetics and kinetics of interdiffusion in Cu/Cu{sub 6}Sn{sub 5} thin film diffusion couples

Book ·
OSTI ID:479282
; ; ; ;  [1]
  1. Binghamton Univ., NY (United States). Physics Dept.
As dimensions in electronic packages decrease, the importance of characterizing interdiffusion in solder/metal couples on a submicron length scale increases. The authors find differential scanning calorimetry to be suitable for the characterization of the energetics and kinetics of interdiffusion in solder/metal diffusion couples. Differential scanning calorimetry studies of interdiffusion in Cu/Cu{sub 6}Sn{sub 5} diffusion couples have shown that the driving force for interdiffusion is similar for thin film composites and for bulk diffusion couples. The heat of formation of Cu{sub 3}Sn from Cu{sub 6}Sn{sub 5} and Cu thin films was found to be {Delta}H{sub r} = {minus}4.3 {+-} 0.3 kJ/mol. Portions of the differential scanning calorimetry scans are identified with diffusion limited growth of Cu{sub 3}Sn. From these calorimetry data they have estimated {tilde D}(cm{sup 2}/s) = D{sub {omicron}} exp({minus}E/k{sub b}T), where k{sub b} is Boltzmann`s constant, D{sub {omicron}} = 3.2 {times} 10{sup {minus}2} cm{sup 2}/s, and E = 0.87 eV/atom.
Sponsoring Organization:
National Science Foundation, Washington, DC (United States)
OSTI ID:
479282
Report Number(s):
CONF-951155--; ISBN 1-55899-301-0
Country of Publication:
United States
Language:
English