High resolution synchrotron x-ray diffraction tomography of large-grained samples
- Georgia Inst. of Tech., Atlanta, GA (United States). School of Materials Science and Engineering
- Stanford Univ., CA (United States)
In order to understand the macroscopic response of polycrystalline structural materials to loading, it is frequently essential to know the spatial distribution of strain as well as the variation of micro-texture on the scale of 100 {micro}m. The methods must be nondestructive, however, if the three-dimensional evolution of strain is to be studied. This paper describes an approach to high resolution synchrotron x-ray diffraction tomography of polycrystalline materials. Results from model samples of randomly-packed, millimeter-sized pieces of Si wafers and of similarly sized single-crystal Al blocks have been obtained which indicate that polychromatic beams collimated to 30 {micro}m diameter can be used to determine the depth of diffracting volume elements within {+-}70 {micro}m. The variation in the two-dimensional distribution of diffracted intensity with changing sample to detector separation is recorded on image storage plates and used to infer the depth of diffracting volume elements.
- Sponsoring Organization:
- Office of Naval Research, Washington, DC (United States); USDOE, Washington, DC (United States)
- OSTI ID:
- 474597
- Report Number(s):
- CONF-960401--; ISBN 1-55899-340-1
- Country of Publication:
- United States
- Language:
- English
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