Grazing incidence x-ray diffraction study of a glass-liquid crystal buried interfaces

Book · Tue Dec 31 04:00:00 EST 1996

OSTI ID:474583

Martinez-Miranda, L J ^[1]

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1. Univ. of Maryland, College Park, MD (United States). Dept. of Materials and Nuclear Engineering

The authors have used Grazing Incidence X-ray Diffraction to study the structure of a liquid crystal (LC) at the buried LC-glass interface in micrometer size LC films. This measurement is done in reflection mode through the glass substrate, which consists of a grating photolithographed onto a 0.2mm slide. This experiment was performed in beamline X22B of the National Synchrotron Light Source at Brookhaven National Laboratory, using 1.3776{angstrom} X-ray radiation. The authors have used both the glass and LC absorption properties to control the penetration depth of the beam into the LC film bulk. The ability to measure LC interfaces in this manner is essential to study any LC device, and its response to applied fields.

• Sponsoring Organization: National Science Foundation, Washington, DC (United States); Maryland Univ., College Park, MD (United States)
• OSTI ID: 474583
• Report Number(s): CONF-960401--; ISBN 1-55899-340-1
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
CRYSTAL STRUCTURE
EXPERIMENTAL DATA
INTERFACES
LIQUID CRYSTALS
X-RAY DIFFRACTION