THICKNESS MEASUREMENT ON POLYMER THIN FILMS WITH THE USE OF A SILICON JUNCTION ALPHA-PARTICLE DETECTOR (in Japanese)
Journal Article
·
· Proc. Japan Conf. Radioisotopes
OSTI ID:4708660
Thickness measurement of polymer thin film by the alpha absorption method in air was investigated. Po/sup 210/ was used as an alpha source, and a solid state detector with good energy resolution was used with a bias of 35 v as a detector of alpha particles. The output of a detector was fed to a single channel pulse height analyzer. The base line of the pulse height analyzer was scanned automatically at a speed of 20 min within a range of 100 v, and the resultant spectra were recorded on the chart by using a rate meter. The distance from the source to the detector was 9 mm. The several samples were in turn inserted between the source and the detector, and the calibration curve for sample thickness was obtained, using the measured results of the energy loss in air based on the reduction in pulse height spectra. Used samples were Tetoron films with various thickness. Thicknesses from 0.9 to 2.1 mg/cm/sup 2/ were measured. Accuracy was about 0.04 mg/cm/sup 2/. Time for measurements was less than 10 minutes. Owing to the absorption by air, the effective alpha -particle energy in the measuring system was reduced. After correction for absorption by air, agreement of the experimental alpha -particle range with the theoretical one was fairly good. (A.G.W.)
- Research Organization:
- Hitachi Central Research Lab., Tokyo
- NSA Number:
- NSA-17-030148
- OSTI ID:
- 4708660
- Journal Information:
- Proc. Japan Conf. Radioisotopes, Journal Name: Proc. Japan Conf. Radioisotopes Vol. Vol: 5th, No. 3
- Country of Publication:
- Country unknown/Code not available
- Language:
- Japanese
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