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Critical scaling behavior of I-V curves in YBa{sub 2}Cu{sub 3}O{sub 7}/PrBa{sub 2}Cu{sub 3}O{sub 7} multilayers

Journal Article · · Physical Review, B: Condensed Matter
; ; ;  [1]; ; ;  [2]
  1. Department of Physics, Kyushu University, Fukuoka 812-81 (Japan)
  2. Laboratory of Superconductivity, Institute of Physics Center for Condensed Matter Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, Peoples Republic of (China)

The current-voltage (I-V) curves were measured for YBa{sub 2}Cu{sub 3}O{sub 7} (24 {Angstrom})/PrBa{sub 2}Cu{sub 3}O{sub 7} (12 {Angstrom} and 96 {Angstrom}) multilayers. The measurements were performed in magnetic fields H up to 10 T with various orientations against the film surface and at temperatures well below the superconducting transition temperature. From the critical scaling analysis, the vortex-glass phase transition temperature T{sub g}, and critical exponents z and {nu} were extracted. We found that these parameters depend on the thickness of PrBa{sub 2}Cu{sub 3}O{sub 7} layers, magnetic fields, and their orientations. For YBa{sub 2}Cu{sub 3}O{sub 7} (24 {Angstrom})/PrBa{sub 2}Cu{sub 3}O{sub 7} (12 {Angstrom}) multilayers, in the high field (H{gt}1 T) the exponents (z{approximately}4.0{endash}6.0, {nu}{approximately}1.1{endash}1.7) are basically consistent with the theoretical estimates of a three-dimensional vortex-glass transition, while for YBa{sub 2}Cu{sub 3}O{sub 7} (24 {Angstrom})/PrBa{sub 2}Cu{sub 3}O{sub 7} (96 {Angstrom}) multilayers, when H{parallel}c, the critical scaling behavior is nearly consistent with that of a quasi-two-dimensional system at H=10 T. Comparing with single-layer YBa{sub 2}Cu{sub 3}O{sub 7} thin films with thickness {gt}1000 {Angstrom}, we found that a size effect on the vortex-glass transition in multilayers exists. {copyright} {ital 1997} {ital The American Physical Society}

OSTI ID:
470856
Journal Information:
Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 2 Vol. 55; ISSN PRBMDO; ISSN 0163-1829
Country of Publication:
United States
Language:
English

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