SILICON PULSE CHAMBER FOR MEASUREMENTS OF X AND GAMMA DOSE RATE.
Journal Article
·
· Nucl. Instrum. Methods 96: No. 2, 239-45(1971).
OSTI ID:4707038
- Research Organization:
- Inst. of Nuclear Research, Swierk, Poland
- NSA Number:
- NSA-26-002322
- OSTI ID:
- 4707038
- Journal Information:
- Nucl. Instrum. Methods 96: No. 2, 239-45(1971)., Other Information: Orig. Receipt Date: 31-DEC-72
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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Related Subjects
N26200* -Instrumentation-Radiation Dosimeters
DOSEMETERS
DOSIMETRY
GAMMA RADIATION
PERFORMANCE
PULSES
SEMICONDUCTOR COUNTERS
SENSITIVITY
SILICON
X RADIATION
GAMMA RADIATION/dosimetry of pulsed
using silicon detectors and charge integration
X RADIATION/dosimetry of pulsed
using silicon detectors and charge integration
RADIATION DETECTORS
SEMICONDUCTOR (SILICON)/ performance for pulsed $gamma$ and x-ray dosimetry by charge integration
DOSEMETERS
DOSIMETRY
GAMMA RADIATION
PERFORMANCE
PULSES
SEMICONDUCTOR COUNTERS
SENSITIVITY
SILICON
X RADIATION
GAMMA RADIATION/dosimetry of pulsed
using silicon detectors and charge integration
X RADIATION/dosimetry of pulsed
using silicon detectors and charge integration
RADIATION DETECTORS
SEMICONDUCTOR (SILICON)/ performance for pulsed $gamma$ and x-ray dosimetry by charge integration