The stabilization of b.c.c. Cu In Cu/Nb nanolayered composites
- Los Alamos National Lab., NM (United States); and others
In this study, we report the formation of b.c.c. Cu in highly textured Cu/Nb nanolayers. A series of Cu/Nb nanolayered films, with alternating Cu and Nb layers, were prepared by dc magnetron sputtering onto Si [100] wafers. The nominal total thickness of each layered film was 1 {mu}m. The layer thickness was varied between 1 nm and 500 nm with the volume fraction of the two phases kept constant at 50%. The deposition rates and film densities were determined through a combination of profilometry and ion beam analysis techniques. Cross-sectional transmission electron microscopy (XTEM) was used to examine the structure, phase and grain size distribution of the as-sputtered films. A JEOL 3000F high resolution TEM was used to characterize the microstructure.
- OSTI ID:
- 468808
- Report Number(s):
- CONF-960877--
- Country of Publication:
- United States
- Language:
- English
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