Probing silicate/sapphire interfaces with AFM and nanoindentation

Book · Thu May 01 04:00:00 EDT 1997

OSTI ID:467597

Lilleodden, E T; Zagrebelny, A V; Ramamurthy, S; Carter, C B ^[1]

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1. Univ. of Minnesota, Minneapolis, MN (United States). Dept. of Chemical Engineering and Materials Science

A nanoindentation study of a calcium-aluminosilicate/{alpha}-alumina system is described. Thin-films of CaAl{sub 2}Si{sub 2}O{sub 8} glass were deposited on {alpha}-alumina single crystals of {l_brace}11{bar 2}0{r_brace} and {l_brace}1{bar 1}02{r_brace} orientations by pulsed-laser deposition. These samples were then subjected to a heat treatment causing the glass to crystallize and to dewet the sapphire surface. A nanoindentation device retrofitted on an atomic force microscope was employed to probe the mechanical properties of the samples. It uniquely enables the characterization of sub-micron features such as the dewet crystallites which necessitate small displacements and exact positioning of the indenter. Strong dependencies on the crystallographic anisotropy were observed in the morphology, but less so on the mechanical properties. In addition, displacement-excursions were observed and are explained in terms of yielding in the substrate.

• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: FG02-92ER45465
• OSTI ID: 467597
• Report Number(s): CONF-960401--; ISBN 1-55899-339-8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM SILICATES
CALCIUM SILICATES
ELASTICITY
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
HEAT TREATMENTS
INTERFACES
LASERS
MECHANICAL PROPERTIES
MICROSTRUCTURE
MORPHOLOGY
SAPPHIRE
SUBSTRATES
THIN FILMS