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EFFICIENCY CALIBRATION OF SEMICONDUCTOR X-RAY DETECTORS IN THE ENERGY RANGE 3 TO 200 keV.

Journal Article · · Nucl. Instrum. Methods 101: No. 1, 153-62(1972).
Research Organization:
Univ. of Guelph, Ont.
Sponsoring Organization:
USDOE
NSA Number:
NSA-26-033471
OSTI ID:
4643517
Journal Information:
Nucl. Instrum. Methods 101: No. 1, 153-62(1972)., Journal Name: Nucl. Instrum. Methods 101: No. 1, 153-62(1972).
Country of Publication:
Country unknown/Code not available
Language:
English

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