EFFICIENCY CALIBRATION OF SEMICONDUCTOR X-RAY DETECTORS IN THE ENERGY RANGE 3 TO 200 keV.
Journal Article
·
· Nucl. Instrum. Methods 101: No. 1, 153-62(1972).
- Research Organization:
- Univ. of Guelph, Ont.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-26-033471
- OSTI ID:
- 4643517
- Journal Information:
- Nucl. Instrum. Methods 101: No. 1, 153-62(1972)., Journal Name: Nucl. Instrum. Methods 101: No. 1, 153-62(1972).
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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Related Subjects
CALIBRATION
EFFICIENCY
KEV RANGE
N46130* --Instrumentation--Radiation Detection Instruments-- Nuclear Spectroscopic Instrumentation
RADIATION DETECTORS
SEMICONDUCTOR/efficiency calibration for x-ray spectroscopy at 3 to 200 keV
SEMICONDUCTOR DETECTORS
X-RAY SPECTROMETERS
X-RAY SPECTROMETERS/efficiency calibration of semiconductor
at 3 to 200 keV
EFFICIENCY
KEV RANGE
N46130* --Instrumentation--Radiation Detection Instruments-- Nuclear Spectroscopic Instrumentation
RADIATION DETECTORS
SEMICONDUCTOR/efficiency calibration for x-ray spectroscopy at 3 to 200 keV
SEMICONDUCTOR DETECTORS
X-RAY SPECTROMETERS
X-RAY SPECTROMETERS/efficiency calibration of semiconductor
at 3 to 200 keV