Efficiency calibration of semiconductor detectors in the x-ray region

Journal Article · Mon Jan 01 04:00:00 EST 1973 · Nucl. Instrum. Methods, v. 112, no. 1-2, pp. 239-241

DOI:https://doi.org/10.1016/0029-554X(73)90801-X· OSTI ID:4407009

Hansen, J S; McGeorge, J C; Fink, R W

A method is outlined for the accurate determination of detection efficiencies of thin planar semiconductor detectors. The method involves experimental measurement of the detection efficiency, combining values obtained from standard sources with values obtained from two experimental techniques developed to provide a larger number of reliable experimental values. A theoretical model, independent of the measured efficiency, is then used to interpolate between experimental values. The reliability of the model is verified by an absolute comparison of the calculated efficiency with the experirmental efficiency. The theoretical values for a typical intrinsic germanium detector are shown to agree within 3% with all experimental values between 6 keV and 60 keV. (auth)

• Research Organization: Georgia Inst. of Tech., Atlanta
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-002699
• OSTI ID: 4407009
• Journal Information: Nucl. Instrum. Methods, v. 112, no. 1-2, pp. 239-241, Journal Name: Nucl. Instrum. Methods, v. 112, no. 1-2, pp. 239-241; ISSN NUIMA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

*SEMICONDUCTOR DETECTORS-- EFFICIENCY
*X-RAY DETECTION-- SEMICONDUCTOR DETECTORS
CALIBRATION
KEV RANGE 01-10
KEV RANGE 10-100
N46110* --Instrumentation--Radiation Detection Instruments-- General Detectors & Monitors