COMPARISON OF POLE FIGURE DATA OBTAINED BY X-RAY DIFFRACTION AND MICROHARDNESS MEASUREMENTS ON ZIRCALOY-2

Conference · Mon Feb 01 04:00:00 EST 1965 · Proceedings; Transactions of the Metallurgical Society of AIME (TMSAAB)

OSTI ID:4634254

Rittenhouse, P. L.; Picklesimer, M. L.

A rapid and semiquantitative method of determining preferred orientation on large numbers of Zircaloy-2 specimens was desired. Knoop microhardness measurements were investigated as a solution to this problem. The variation of Knoop microhardness measurements on selected planes as a function of indenter axis relative to crystallographic or fabrication directions was determined for four lots of polycrystalline Zircaloy-2, on which both conventional and inverse pole figures had been determined, and seven Zircaloy-2 single crystals. Data from the single crystals was used to construct a polar coordinate hardness contour map. With use of an empirical relationship between the single crystal hardnesses and those of the polycrystalline material conventional pole figures could be constructed which compare favorably with those determined by x-ray diffraction. A quantitative relationship with inverse pole figure data was also obtained. To determine preferred orientation qualitatively from hardness data requires a minimum of twelve measurements per plane on three, preferably orthogonal, planes. The exact procedure requires attention to grain size, specimen preparation, and indenter load. The time required for preparation, measurement, and analysis is of the order of 45 to 60 min.

• Research Organization: Oak Ridge National Lab., TN
• Sponsoring Organization: US Atomic Energy Commission (AEC)
• DOE Contract Number: W-7405-ENG-26
• NSA Number: NSA-19-022991
• OSTI ID: 4634254
• Report Number(s): ORNL-P-1165; CONF-650210-3
• Conference Information: Journal Name: Proceedings; Transactions of the Metallurgical Society of AIME (TMSAAB)
• Country of Publication: United States
• Language: English

Related Subjects

ANISOTROPY
CONFERENCE
CONFIGURATION
CRYSTALS
DIAGRAMS
DIFFRACTION
HARDNESS
MEASURED VALUES
METALS, CERAMICS, AND OTHER MATERIALS
MONOCRYSTALS
Properties and Structure
USA
WASHINGTON
X RADIATION
ZIRCALOY