A measurement of the lifetime of the 804 keV level in Tm169
A delayed coincidence measurement of the lifetime of the 8.4-keV level in Tm169 is reported. A Yb169 sample that decays by electron capture to Tm169 was used. The decay scheme and conversion electron spectrum of the ground state decay of Yb196 are illustrated. The half life of the 8.4-kev level in Tm169 was found to be 3.45 plus or minus 0.25 ns.
- Research Organization:
- Uppsala Univ.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-17-040069
- OSTI ID:
- 4626287
- Journal Information:
- Phys. Letters, Journal Name: Phys. Letters Vol. Vol: 6
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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