Microwave Reflection Techniques for Dense Plasma Diagnostics

Technical Report · Wed Mar 10 04:00:00 EST 1965

DOI:https://doi.org/10.2172/4607539· OSTI ID:4607539

Takeda, Susumu ^[1]; Tsukishima, Takashige ^[2]

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1. Nagoya University, Nagoya (Japan)
2. National Bureau of Standards, Washington, DC (United States)

The microwave reflection method for measuring the electron density whose plasma frequency is higher than the probing frequency is described in detail. Various expressions and formulas which are useful for a variety of experimental conditions are given. A method to extend further the measurable density range is proposed. The fringing field effects are considered when a waveguide is used as a probe. References are given to the experimental works which substantiate the theoretical analyses. Also included are the analyses of reflection by a non-uniform boundary and also by an inhomogeneous plasma.

• Research Organization: National Bureau of Standards, Washington, DC (United States)
• Sponsoring Organization: US Department of Commerce
• NSA Number: NSA-19-027615
• OSTI ID: 4607539
• Report Number(s): NBS-TN--256
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CIRCUITS
ELECTRON DENSITY
ELECTRONS
EQUATIONS
FREQUENCY
MEASURED VALUES
MICROWAVES
PLASMA
PLASMA DIAGNOSTICS
PROBES
REFLECTION
SAMPLING
WAVEGUIDES