Soft x-ray and Auger electron spectroscopy of single and double electron capture processes in slow Ne{sup 8+}+He collisions

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147792· OSTI ID:451962

Bliman, S; Cornille, M ^[1]; Langereis, A; Nordgren, J ^[2]; Bruch, R; Phaneuf, R; Swenson, J ^[3]; Schneider, D ^[4]

---

1. Universite de Marne la Valle (France)
2. Department of Physics, University of Uppsala (Sweden)
3. Department of Physics, Univerity of Nevada, Reno, Nevada 89557 (United States)
4. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

We have performed high resolution extreme ultraviolet (EUV) photon and Auger electron measurements to elucidate single and double capture processes in Ne{sup 8+}+He single collisions at 80 keV impact energy. Numerous new transitions both in the Auger and the EUV spectra have been identified by means of extensive theoretical calculations and correlation diagrams. These data are of importance for the modeling of impurities in plasma and for future plasma diagnostics. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 451962
• Report Number(s): CONF-960543--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
AUGER EFFECT
AUGER ELECTRON SPECTROSCOPY
CATIONS
ELECTRON CAPTURE
EXTREME ULTRAVIOLET SPECTRA
HELIUM
ION-ATOM COLLISIONS
KEV RANGE 10-100
NEON
NEON IONS
PLASMA DIAGNOSTICS
PLASMA IMPURITIES
SOFT X RADIATION
X-RAY SPECTROSCOPY
X-ray emission spectra
atom-ion collisions
helium neutral atoms
plasma collision processes