Application of high-resolution, high-sensitivity spectrometry in the extreme ultraviolet wavelength range for diagnostics of single and double electron capture processes in He{sup 2+}+He and Ar{sup 8+}+He collisions

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147794· OSTI ID:452839

Bruch, R; Kantsyrev, V; Golovkina, V; Shlyaptseva, A; Golovkin, I; Phaneuf, R ^[1]; Schneider, D ^[2]

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1. Department of Physics, University of Nevada Reno, Reno, Nevada 89557 (United States)
2. N-Division, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

We have applied a new, more efficient diagnostic technique for studies of extreme ultraviolet (EUV) radiation from multicharged ions interacting with He gas. Following single and double electron capture and one electron capture plus target-ion excitation in He{sup 2+}+He and Ar{sup 8+}+He collisions, the subsequent emitted EUV photons are analyzed with a high-resolution 2.2 m grazing incidence monochromator in conjunction with a new type of glass capillary converter (GCC) specifically designed for the EUV wavelength region. This new optical device images a horizontal cylindrical ion beam segment onto the vertical entrance slit of the monochromator. With this new imaging technique a spectral intensity enhancement of about 10 has been achieved over a distance of about 60 cm. By further optimizing this method an enhancement of the flux density of EUV radiation of about 20{endash}30 is expected. As prototype examples, new advanced EUV spectra arising from He{sup 2+}+He and Ar{sup 8+}+He collisions are presented and discussed. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 452839
• Report Number(s): CONF-960543--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ARGON
ARGON IONS
CATIONS
DESIGN
ELECTRON CAPTURE
EXTREME ULTRAVIOLET RADIATION
EXTREME ULTRAVIOLET SPECTRA
GLASS
HELIUM
HELIUM IONS
ION-ATOM COLLISIONS
OPTICS
OPTIMIZATION
PLASMA DIAGNOSTICS
ULTRAVIOLET SPECTROMETERS
atom-ion collisions
helium neutral atoms
ionisation