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Title: High-accuracy time- and space-resolved Stark shift measurements (invited)

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147826· OSTI ID:451939
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  1. Sandia National Laboratories, Albuquerque, New Mexico 87175-1196 (United States)

Stark-shift measurements using emission spectroscopy are a powerful tool for advancing understanding in many plasma physics experiments. We use simultaneous two-dimensional space- and time-resolved spectra to study the electric field evolution in the 20 TW Particle Beam Fusion Accelerator II ion diode acceleration gap. Fiber optic arrays transport light from the gap to remote streaked spectrographs operated in a multiplexed mode that enables recording time-resolved spectra from eight spatial locations on a single instrument. Design optimization and characterization measurements of the multiplexed spectrograph properties include the astigmatism, resolution, dispersion, and sensitivity. A semiautomated line-fitting procedure determines the Stark shift and the related uncertainties. Fields up to 10 MV/cm are measured with an accuracy {plus_minus}2{percent}{endash}4{percent}. Detailed tests of the procedure confirm that the uncertainty in the wavelength-shift error bars is less than {plus_minus}20{percent}. Development of an active spectroscopy probe technique that uses laser-induced fluorescence from an injected atomic beam to obtain three-dimensional space- and time-resolved measurements of the electric and magnetic fields is in progress. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
451939
Report Number(s):
CONF-960543-; ISSN 0034-6748; TRN: 97:006296
Journal Information:
Review of Scientific Instruments, Vol. 68, Issue 1; Conference: 11. annual high-temperature plasma diagnostics conference, Monterey, CA (United States), 12-16 May 1996; Other Information: PBD: Jan 1997
Country of Publication:
United States
Language:
English