Spectroscopic techniques for measuring ion diode space-charge distributions and ion source properties
- and others
We are using time- and space-resolved visible spectroscopy to measure applied-B ion diode dynamics on the 20 TW Particle Beam Fusion Accelerator II. Doppler broadening of fast Li atoms, as viewed parallel to the anode, is used in a charge-exchange model to obtain the Li{sup +} ion divergence within 100 {mu}m of the anode surface. The characteristic Stark/Zeeman shifts in spectra of alkali neutrals or singly-ionized alkaline-earths are used to measure the strong electric (10{sup 9} V/m) and magnetic ({approximately}6 T) fields in the diode gap. Large Stark shifts within 0.5 mm of the anode indicate the LiF emits with a finite field threshold rather than with Child- Langmuir-type emission, and the small slope in the electric field indicates an unexpected build-up of electrons near the anode. In the diode gap, we aim to unfold fields to quantify the time-dependent ion and electron space-charge distributions that determine the ion beam properties. Observed electric field non-uniformities give local beam deflections that can be comparable to the total beam microdivergence. We are implementing active laser absorption and laser-induced fluorescence spectroscopy on low-density Na atoms injected into the diode gap prior to the power pulse. The small Doppler broadening in the Na spectra should allow simultaneous electric and magnetic field mapping with improved spatial resolution.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 254935
- Report Number(s):
- SAND-96-0617C; CONF-960610-9; ON: DE96011683; TRN: 96:015239
- Resource Relation:
- Conference: BEAMS `96: 11. international conference on high-power particle beams, Prague (Czech Republic), 10-14 Jun 1996; Other Information: PBD: [1996]
- Country of Publication:
- United States
- Language:
- English
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