Edge density profile measurements in TdeV using amplitude modulation reflectometry

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147733· OSTI ID:451935

Pinsonneault, D; Quirion, B; Lachambre, J; Legros, C ^[1]

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1. Centre canadien de fusion magnetique, 1804 Boul. Lionel-Boulet, Varennes, Quebec, J3K 1S1 (CANADA)

A single channel AM reflectometer, operating in the frequency range of 33.0{le}f{le}50.0 GHz, has been developed to provide edge electron density profiles on TdeV. The X-mode cut-off layer, covering densities n{sub e}{le}10{sup 19} m{sup {minus}3} for 1.5 T operation, is used to measure a portion of the plasma edge region 0.9{le}r/a{le}1.2. Briefly, our design consists in launching a microwave beam amplitude modulated at 201 MHz. The reflected wave is detected and downconverted to 1 MHz to facilitate filtering and phase detection. Finally, a linear phase detector compares the phase of the resulting signal (1 MHz) with that of the reference source. The design and construction of the reflectometer will be described and preliminary results presented. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 451935
• Report Number(s): CONF-960543--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
DESIGN
FLUCTUATIONS
MICROWAVE EQUIPMENT
MODULATION
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA RADIAL PROFILES
REFLECTION
TOKAMAK DEVICES
amplitude modulation
microwave reflectometry
millimetre wave measurement
phase measurement
plasma boundary layers
reflectometers