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Characterization of intermixing at the CdS/CdTe interface in CSS deposited CdTe

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.49365· OSTI ID:451069
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  1. National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)

CdS/CdTe structures deposited on different substrates are analyzed using transmission electron microscopy (TEM), secondary ion mass spectrometry (SIMS), optical transmission, atomic force microscopy (AFM), X-ray diffraction (XRD) and photoluminescence (PL). The microstructure of CdTe was found to be independent of CdS crystallinity, and the structural defects at CdS/CdTe interface are generated principally by the lattice mismatch between CdS and CdTe. The interdiffusion at the CdS/CdTe interface was found to be a function of substrate temperature and CdCl{sub 2} heat treatment. {copyright} {ital 1996 American Institute of Physics.}

Research Organization:
National Renewable Energy Laboratory
DOE Contract Number:
AC36-83CH10093
OSTI ID:
451069
Report Number(s):
CONF-9605265--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 353; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English