Transparent ion intercalation films of Zr{endash}Ce oxide

Journal Article · Sat Feb 01 04:00:00 EST 1997 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.364059· OSTI ID:450266

Veszelei, M; Kullman, L; Azens, A; Granqvist, C G ^[1]; Hjoervarsson, B ^[2]

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1. Department of Materials Science, Uppsala University, P. O. Box 534, S-751 21 Uppsala (Sweden)
2. Department of Physics, Uppsala University, P. O. Box 530, S-751 21 Uppsala (Sweden)

Zr{endash}Ce oxide films were made by reactive dc magnetron cosputtering. The elemental composition was determined by Rutherford backscattering spectrometery and the crystalline structure by x-ray diffraction. Li intercalation/deintercalation was accomplished potentiodynamically in a liquid electrolyte. The films remained fully transparent irrespective of their degree of lithiation, which may be reconciled with a population/depopulation of Ce 4f levels. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 450266
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 4 Vol. 81; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CERIUM OXIDES
CLATHRATES
CRYSTAL STRUCTURE
IONIC CONDUCTIVITY
LIGHT TRANSMISSION
LITHIUM
OPACITY
RUTHERFORD SCATTERING
SPUTTERING
THIN FILMS
X-RAY DIFFRACTION
ZIRCONIUM OXIDES