ACTIVATION ENERGY OF DEFECTS IN NEUTRON IRRADIATED SILICON.
Journal Article
·
· IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 4, 3-5(Aug. 1968).
- Research Organization:
- Standard Telecommunication Labs., Ltd., Harlow, Eng.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-22-044264
- OSTI ID:
- 4487265
- Journal Information:
- IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 4, 3-5(Aug. 1968)., Other Information: Orig. Receipt Date: 31-DEC-68
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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