X-ray diffraction study of films based on tin and indium oxides (in French)
Journal Article
·
· Thin Solid Films
Thin films of In2O3:Sn have been produced by an induced discharge in a cavity made with a mixture of In2O3 and SnO2. The growth of these films on glass substrates has been studied at two temperatures. The fine structure of the x-ray diffractogram indicates that tin is deposited as SnO. Annealing in air at 400 deg C increases the resistivity when the film is crystalline and decreases it when the film is amorphous.
- Research Organization:
- Univ., Mons, Belgium
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-29-000923
- OSTI ID:
- 4435181
- Journal Information:
- Thin Solid Films, Journal Name: Thin Solid Films Journal Issue: 1 Vol. 18; ISSN 0040-6090
- Publisher:
- Elsevier
- Country of Publication:
- Country unknown/Code not available
- Language:
- French
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