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Title: Trace element analysis of environmental samples using radioisotopic-excited x-ray fluorescence

Journal Article · · Trans. Amer. Nucl. Soc., v. 17, pp. 103-104
OSTI ID:4408130

From joint meeting of the American Nuclear Society and the Atomic Industrial Forum and Nuclear Energy Exhibition; San Francisco, California, USA (11 Nov 1973). See CONF-731101-.

Research Organization:
Batelle Memorial Inst., Richland, WA
NSA Number:
NSA-29-004849
OSTI ID:
4408130
Journal Information:
Trans. Amer. Nucl. Soc., v. 17, pp. 103-104, Conference: Joint meeting of the American Nuclear Society and the Atomic Industrial Forum and Nuclear Energy Exhibition, San Francisco, California, USA, 11 Nov 1973; Other Information: See CONF-731101--. Orig. Receipt Date: 30-JUN-74
Country of Publication:
Country unknown/Code not available
Language:
English