Trace element analysis using x-ray tubes and semiconductor detector spectrometers

Journal Article · Thu Nov 01 00:00:00 EST 1973 · Trans. Amer. Nucl. Soc., v. 17, pp. 104-105

OSTI ID:4393214

Giauque, R D

From joint meeting of the American Nuclear Society and the Atomic Industrial Forum and Nuclear E nergy Exhibition; San Francisco, California, USA (11 Nov 1973). See CONF-731101-.

• Research Organization: Univ. of California, Berkeley
• NSA Number: NSA-29-004850
• OSTI ID: 4393214
• Journal Information: Trans. Amer. Nucl. Soc., v. 17, pp. 104-105, Conference: Joint meeting of the American Nuclear Society and the Atomic Industrial Forum and Nuclear Energy Exhibition, San Francisco, California, USA, 11 Nov 1973; Other Information: See CONF-731101--. Orig. Receipt Date: 30-JUN-74
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

N40130* -Chemistry-Analytical & Separations Chemistry- Radiometric & Radiochemical Procedures
*BROMINE- X-RAY FLUORESCENCE ANALYSIS
*CHROMIUM- X-RAY FLUORESCENCE ANALYSIS
*IRON- X-RAY FLUORESCENCE ANALYSIS
*LEAD- X-RAY FLUORESCENCE ANALYSIS
*MERCURY- X-RAY FLUORESCENCE ANALYSIS
*NICKEL- X-RAY FLUORESCENCE ANALYSIS
*TITANIUM- X-RAY FLUORESCENCE ANALYSIS
*ZINC- X-RAY FLUORESCENCE ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
SENSITIVITY
TRACE AMOUNTS