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Induction of dominant lethality by x rays in a radiosensitive strain of yeast

Journal Article · · Mutat. Res., v. 20, no. 1, pp. 45-51
X-ray-survival curves of haploid, diploid, triploid, and tetraploid yeast strains homozygous for the x-ray-sensitive mutation rad52 (previously xsI) arc presented. These curves suggest that strains carrying the rad52 mutation may be more susceptible than wild type to x-ray-induced dominant lethal damage. For the crosses (+x+, rad52 x rad52, +x rad52, rad52 x+) in which only one parent was irradiated, the relationships between zygote survival and x-ray dose were similar except for rad52 x rad52. In this cross a considerably higher frequency of dominant lethal damage was observed. This observation indicates that the rad52 mutant lacks a repair system for x-ray damage and is consistent with the proposal that unrepaired chromosome damage is the event that leads to dominant lethality and reproductive cell death. (auth)
Research Organization:
Univ. of California, Berkeley
Sponsoring Organization:
USDOE
NSA Number:
NSA-29-005301
OSTI ID:
4404631
Journal Information:
Mutat. Res., v. 20, no. 1, pp. 45-51, Journal Name: Mutat. Res., v. 20, no. 1, pp. 45-51; ISSN MUREA
Country of Publication:
Country unknown/Code not available
Language:
English