Threefold electron scattering on graphite observed with C{sub 60}-adsorbed STM tips

Journal Article · Fri Sep 06 04:00:00 EDT 1996 · Science

DOI:https://doi.org/10.1126/science.273.5280.1371· OSTI ID:436766

Kelly, K F; Sarkar, D; Hale, G D; Oldenburg, S J; Halas, N J ^[1]

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1. Rice Univ., Houston, TX (United States)

The scanning tunnel microscope (STM) has been used to observe threefold symmetric electron scattering from point defects on a graphite surface. These theoretically predicted electronic perturbations could not be observed with a bare metal tip but could only be imaged when a fullerene (C{sub 60}) molecule was adsorbed onto the tunneling region (apex) of an STM tip. Functionalizing an STM tip with an appropriate molecular adsorbate alters the density of states near the Fermi level of the tip and changes its imaging characteristics. 18 refs., 1 fig.

• Sponsoring Organization: USDOE
• OSTI ID: 436766
• Journal Information: Science, Journal Name: Science Journal Issue: 5280 Vol. 273; ISSN SCIEAS; ISSN 0036-8075
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADSORPTION
ELECTRONS
FULLERENES
SCANNING ELECTRON MICROSCOPY
SCATTERING