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Modeling of the microwave surface impedance of current biased YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.364109· OSTI ID:435103
 [1]
  1. Department of Microwave Technology, Chalmers University of Technology, S-412 96 Goeteborg (Sweden)
A theoretical and experimental investigation is made of the surface impedance of dc current biased high-quality epitaxial YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films using a coplanar resonator technique. The isotropic Ginzburg-Landau theory and a current-dependent coupled-grain model are used to model the resonant frequency shift and the change in unloaded quality factor Q{sub 0} due to the bias current. Good quantitative agreement is obtained between the two models and the measured resonant frequency shift. The change in Q{sub 0}, determined from measurements, can be explained by the coupled-grain model. The Ginzburg-Landau theory predicts a change in Q{sub 0} which is several times less than given by measurements. {copyright} {ital 1997 American Institute of Physics.}
OSTI ID:
435103
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 81; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English