Scaling behavior of 1/f noise in high-temperature superconductor Josephson junctions

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.119281· OSTI ID:435086

Marx, A; Gross, R ^[1]

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1. II. Physikalisches Institut, Universitaet zu Koeln, D-50937 Koeln (Germany)

Extensive studies of the low frequency 1/f noise in high-temperature superconducting (HTS) Josephson junctions of various types and materials have been performed for a wide range of operating parameters. The origin of the measured voltage fluctuations can be traced back to the trapping and release of charge carriers in trapping centers in an insulating barrier, giving rise to correlated fluctuations of the junction critical current I{sub c} and normal-state resistance R{sub n}. We observed a linear dependence of the normalized critical current and resistance fluctuations on R{sub n}, which suggests a constant density of trapping centers for the HTS Josephson junctions. The scaling of the normalized fluctuations is in good agreement with the previously found scaling relation I{sub c}R{sub n}{proportional_to}1/R{sub n} and supports a junction model assuming a leaky tunnel barrier. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 435086
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 1 Vol. 70; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
CRITICAL CURRENT
CRYSTAL DEFECTS
ELECTRIC CONDUCTIVITY
FLUCTUATIONS
GRAIN BOUNDARIES
HIGH-TC SUPERCONDUCTORS
JOSEPHSON EFFECT
JOSEPHSON JUNCTIONS
NOISE
SCALING LAWS
TRAPPING