HRTEM analysis of solid precipitates in Xe-implanted aluminum
- Argonne National Lab., IL (United States)
- National Research Inst. for Metals, Tsukuba, Ibaraki (Japan). Tsukuba Lab.
High-resolution TEM was carried out to determine shape and atomic arrangement of solid Xe precipitates in Al. Polycrystalline Al TEM specimens were implanted with 30 keV Xe{sup +} at RT to a dose of 3x10{sup 20} ions/m{sup 2} and then annealed at 523 K. Below a size 4 nm dia, the Xe precipitates are solid with an fcc crystal structure mesotacticly aligned with the Al lattice. In HRTEM along [011] projection, the difference in the lattice parameters of solid Xe and Al produces a precipitate image dominated by a 2-D Moire pattern that repeats in both the <001> and <111> directions every 3 Al (or 2 Xe) lattice spacings. Multi-slice image simulations, using a 3-D atomic model, demonstrates that the precipitates are tetradecahedra with faces parallel to the dense {l_brace}111{r_brace} planes and the {l_brace}100{r_brace} planes. Off-Bragg illumination of the precipitates minimizes Al lattice fringes and generates precipitate images which are in good agreement with the model.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 434927
- Report Number(s):
- ANL/MSD/CP--89719; CONF-960994--15; ON: DE97000984
- Country of Publication:
- United States
- Language:
- English
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