Observation of an elementary cuboctahedron of Xe nanocrystal in an Al matrix.
When a noble gas element such as Xe is implanted in an fcc metal matrix such as Al at room temperature, a fine dispersion of precipitates forms. The precipitates are elementary fcc crystals up to diameters of several nanometers (for Xe in Al, 8-10 rim), above which they are non-crystalline. The precipitates exhibit a cube-on-cube orientation relation with the matrices and have lattice parameters which are much larger than those of the matrices (a{sub Xe} = 1.5a{sub Al}). Thus the interphase interfaces are incommensurate though the lattices are isotactic. The precipitates assume the shape of matrix cavities; for an Al matrix, at equilibrium this is a cuboctahedron, a {r_brace}111{l_brace} octahedron truncated at the corners on {l_brace}100{r_brace}. Fig. 1 is a sketch of a dispersion of such cuboctahedra, viewed approximately along a {l_angle}110{r_angle}. For this study specimens were prepared in the HVEM-Tandem Facility at Argonne National Laboratory by implanting 35 keV Xe to a dose of 4x10{sup 19} m{sup {minus}2} into well-annealed 5N Al discs which had been thinned by jet electropolishing. The range of the implant is approximately 25 nm. Specimens were examined at high resolution in the JEOL ARM-1000 high voltage electron microscope (HVEM) at the High Resolution Beam Station of the National Research Institute for Metals (NRIM), Tsukuba, Japan. The HVEM was operated at 1 MeV with a LaB{sub 6} electron source. A series of studies of electron irradiation effects in this material have been conducted, which have revealed a number of irradiation-induced phenomena including migration within the matrix, changes in shape, faulting, melting, crystallization and coalescence of Xe precipitates. In this presentation, the structure of the smallest possible cuboctahedral Xe nanocrystal will be discussed and its apparently random migration under the influence of the electron irradiation will be demonstrated.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 12365
- Report Number(s):
- ANL/MSD/CP-98511; TRN: US0102399
- Resource Relation:
- Conference: Microscopy and Microanalysis '99, Portland, OR (US), 08/01/1999--08/05/1999; Other Information: PBD: 10 Mar 1999
- Country of Publication:
- United States
- Language:
- English
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