Electromigration in metallic systems
From meeting of the American Institute of Mining, Metallurgical and Petroleum Engineers; Philadelphia, Pennsylvania, USA (29 May The more likely contributions to electromigration in metallic single crystals and polycrystals are briefly discussed. These include such factors as driving force, diffusion, and local binding energy. The driving force is particularly emphasized, especially in liquid alloys. Such systems are thought to be simpler than the corresponding solid alloys, which present complications due to the details of crystalline and defect structure. A simple scattering approach is described and applied to selected liquid alloy systems. Implications for controlling electromigration in such practical devices as those based on thin film circuits are considered. (5 tables, 19 figures, 122 references) (auth)
- Research Organization:
- Ohio State Univ., Columbus (USA)
- NSA Number:
- NSA-29-018870
- OSTI ID:
- 4340885
- Report Number(s):
- COO--2037-18; CONF-730563--3
- Country of Publication:
- United States
- Language:
- English
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