Relative measurements of stopping cross section factors by backscattering

Journal Article · Mon Dec 17 04:00:00 EST 1973 · Thin Solid Films, v. 19, no. 2, pp. 195-204

DOI:https://doi.org/10.1016/0040-6090(73)90055-2· OSTI ID:4335224

Feng, J S.Y.; Chu, W K; Nicolet, M A; Mayer, J W

From international conference on ion beam surface layer analysis; Yorktown Heights, NY (18 Jun 1973). A procedure for evaluating relative stopping cross section factors from the ratios of two heights in a single back-scattering spectrum is described. The method, which requires a two-layered target, is used to test the stopping cross sections of 1 to 2 MeV /sup 4/He/sup +/ ions incident on Au, Ag, Cu, Si and Al. The ratios of the heights of Au, Ag and Cu are consistent with published stopping cross section data. The Au--Al height ratio is within the errors quoted for the Au and Al stopping cross section measurements. The Al-- Si height ratio differs significantly from the expected value. It is also shown that the height ratio changes slightly as a function of the thickness of the surface layer. (auth)

• Research Organization: California Inst. of Tech., Pasadena
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-027643
• OSTI ID: 4335224
• Journal Information: Thin Solid Films, v. 19, no. 2, pp. 195-204, Journal Name: Thin Solid Films, v. 19, no. 2, pp. 195-204; ISSN THSFA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

*ALUMINIUM-- ION COLLISIONS
*COPPER-- ION COLLISIONS
*GOLD-- ION COLLISIONS
*HELIUM IONS-- STOPPING POWER
*SILICON-- ION COLLISIONS
*SILVER-- ION COLLISIONS
CATIONS
CROSS SECTIONS
N60100* --Physics (Atomic & Molecular)--Atomic
Electron
Ion & Molecular Beams & Reactions
N72100 --Physics (Radiation & Shielding)--Radiation Physics
SURFACES