Rutherford back-scattering as a tool to determine electronic stopping powers in solids
Journal Article
·
· Thin Solid Films
From international conference on ion beam surface layer analysis; Yorktown Heights, NY (18 Jun 1973). Absolute measurements of the energy distributions of energetic light ions backscattered from solids can be used to determine the electronic stopping power of these ions in the solid. Stopping powers of protons (50 to 150 keV) in different metals and metal oxides (Hb, Ta, Ta2O5) were measured by this method. The results depend strongly on the cleanliness of the surface region. The experiments show deviations from the additive rule for the stopping power in compounds in this energy range.
- Research Organization:
- Max-Planck-Institut fuer Plasmaphysik, Garching, Ger.
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-29-027644
- OSTI ID:
- 4306849
- Journal Information:
- Thin Solid Films, Journal Name: Thin Solid Films Journal Issue: 2 Vol. 19; ISSN 0040-6090
- Publisher:
- Elsevier
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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