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Cooperative chemical rebonding in the segregation of impurities in silicon grain boundaries

Technical Report ·
DOI:https://doi.org/10.2172/432990· OSTI ID:432990
; ;  [1];  [2]
  1. Oak Ridge National Lab., TN (United States). Solid State Div.
  2. Vanderbilt Univ., Nashville, TN (United States). Dept. of Physics and Astronomy

With ab initio calculations the authors show that the experimentally observed large segregation energies of As at Si grain boundaries can be explained by the formation of isolated dimers or ordered chains of dimers of threefold-coordinated As along the cores of grain boundary dislocations. They also find the intriguing possibility that As segregation may drive structural transformation of certain grain boundaries. Recently, they have obtained the first atomic-resolution STEM images of As in a Si grain boundary, consistent with the formation of As dimers. Segregation energy of As dimers was found to be significantly higher in isolated dislocation cores, where larger site-variation in strain than in grain boundaries lead to further lowering of the electronic levels of As deep into the bandgap.

Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States); Office of Naval Research, Washington, DC (United States); Oak Ridge Inst. for Science and Education, TN (United States)
DOE Contract Number:
AC05-96OR22464
OSTI ID:
432990
Report Number(s):
CONF-961202--59; ON: DE97002634; CNN: Grant N00014-95-1-0906
Country of Publication:
United States
Language:
English

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