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BETA GAGE FOR LOCALIZED MEASUREMENTS ON THIN FILMS

Technical Report ·
OSTI ID:4311972
A gage employing a narrow ' pencil'' of BETA rays has been developed to determine the thickness of films used as cyclotron targets. The instrument allows an estimate of the evenness of films a few mg/cm/ thick by reproducibly scanning the sample with a collimated BETA -ray beam 3/32 in. in diameter. (auth)
Research Organization:
Michigan. Univ., Ann Arbor
NSA Number:
NSA-12-005510
OSTI ID:
4311972
Report Number(s):
AECU-3175
Country of Publication:
United States
Language:
English

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