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Evaluating mechanical properties of thin layers using nanoindentation and finite-element modeling: Implanted metals and deposited layers

Conference ·
OSTI ID:431184

We present a methodology based on finite-element modeling of nanoindentation data to extract reliable and accurate mechanical properties from thin, hard films and surface-modified layers on softer substrates. The method deduces the yield stress, Young`s modulus, and hardness from indentations as deep as 50% of the layer thickness.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
431184
Report Number(s):
SAND--96-1682C; CONF-961202--22; ON: DE97002460
Country of Publication:
United States
Language:
English

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