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U.S. Department of Energy
Office of Scientific and Technical Information

TRANSISTORIZATION OF NUCLEAR COUNTING CIRCUITS

Technical Report ·
OSTI ID:4306074
The advantages of long operational life, low power drain and miniaturization may be realized in nuclear counting circuits through the use of transistors. The disadvantage of instability, due to the effects of temperature change in the transistor, may be minimized in counting circuit designs. The predominant effects are a change in the grounded emitter current gain and a variation of the leakage current through the transistor. The binary circuit is analyzed for stability criteria, and testing procedures are suggested. Representative circuits of a binary stage, amplitude discriminator, one shot multivibrator, and ratemeters are included. (auth)
Research Organization:
New York Operations Office. Health and Safety Lab., AEC
NSA Number:
NSA-12-006717
OSTI ID:
4306074
Report Number(s):
HASL-4
Country of Publication:
Country unknown/Code not available
Language:
English

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