Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material
Patent
·
OSTI ID:426627
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field. 6 figs.
- Research Organization:
- AT&T
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- Patent Number(s):
- US 5,594,240/A/
- Application Number:
- PAN: 8-407,148
- OSTI ID:
- 426627
- Resource Relation:
- Other Information: PBD: 14 Jan 1997
- Country of Publication:
- United States
- Language:
- English
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