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Title: Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

Abstract

A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.

Inventors:
 [1]
  1. Albuquerque, NM
Publication Date:
Research Org.:
AT & T CORP
OSTI Identifier:
870786
Patent Number(s):
US 5594240
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
strain-optic; voltage; monitor; strain; causes; change; optical; absorption; crystalline; material; shift; edge; measure; resulting; electric; field-induced; deformation; piezoelectric; electrostrictive; providing; simple; accurate; means; measuring; applied; direct; contact; subjecting; field; voltage monitor; crystalline material; optical absorption; voltage applied; direct contact; electric field; absorption edge; measuring voltage; induced deformation; optic voltage; rate means; rate mean; accurate means; /250/324/359/

Citation Formats

Weiss, Jonathan D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States: N. p., 1997. Web.
Weiss, Jonathan D. Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material. United States.
Weiss, Jonathan D. Wed . "Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material". United States. https://www.osti.gov/servlets/purl/870786.
@article{osti_870786,
title = {Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material},
author = {Weiss, Jonathan D},
abstractNote = {A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1997},
month = {1}
}

Patent:

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