New Insights into Fully-Depleted SOI Transistor Response During Total-Dose Irradiation
Conference
·
OSTI ID:4262
- Sandia National Laboratories
Worst-case bias configuration for total-dose testing fully-depleted SOI transistors was found to be process dependent. No evidence was found for total-dose induced snap back. These results have implications for hardness assurance testing.
- Research Organization:
- Sandia National Laboratories, Albuquerque, NM, and Livermore, CA
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 4262
- Report Number(s):
- SAND99-0559J; ON: DE00004262
- Country of Publication:
- United States
- Language:
- English
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