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Low-Background Tungsten Filaments for Surface Ionization Mass Spectroscopy

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1716628· OSTI ID:4252363
A problem encountered in high-sensitivity solidsample mass spectroscopy when using a multiple filament ionization source in the presence of a number of unusual background peaks. Investigators think that polymer ions of potassium cause the most important of these peaks. A method is described for producing tungsten filaments from which it has been possible to detect these ions. The basic method consists of decomposing tungsten hexacarbonyl vapor on a tantalum blank at a temperature high enough to vaporize the tantalum backing from the deposited tungsten. Tungsten filaments containing less than 20% residual tantalum are produced by this means. (A.C.)
Research Organization:
Univ. of California, Livermore
Sponsoring Organization:
USDOE
NSA Number:
NSA-13-014491
OSTI ID:
4252363
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 30; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
Country unknown/Code not available
Language:
English

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