Low-Background Tungsten Filaments for Surface Ionization Mass Spectroscopy
Journal Article
·
· Review of Scientific Instruments
A problem encountered in high-sensitivity solidsample mass spectroscopy when using a multiple filament ionization source in the presence of a number of unusual background peaks. Investigators think that polymer ions of potassium cause the most important of these peaks. A method is described for producing tungsten filaments from which it has been possible to detect these ions. The basic method consists of decomposing tungsten hexacarbonyl vapor on a tantalum blank at a temperature high enough to vaporize the tantalum backing from the deposited tungsten. Tungsten filaments containing less than 20% residual tantalum are produced by this means. (A.C.)
- Research Organization:
- Univ. of California, Livermore
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-13-014491
- OSTI ID:
- 4252363
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 30; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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