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RECOVERY OF ELECTRON-IRRADIATED COPPER. II. INTERSTITIAL MIGRATION

Journal Article · · Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D
Several experiments are presented dealing with substages I/sub D/ (33 to 48 deg K) and I/sub E/ (48 to 65 deg K) of Stage I (14 deg K-65 deg K) recovery in electron-irradiated pure copper. It is concluded that both I/sub D/ and I/sub E/ represent the recovery due to the free diffusion of a defect, presumably an interstitial atom, with an activation energy for motion E/sub m/ = 0.12 plus or minus 0.005 ev. I/sub D/ is the result of correlated recovery (the interstitial returns to the vacancy from which it came) while I/sub E/ is the result of uncorrelated recovery (the interstitial travels to a distant sink). The migrating interstitial is shown to interact with vacancies, traps, and other interstitials leading respectively to annihilation, trapping, and cluster formation. The interaction between two interstitials leading to cluster formation is found to be comparable with the annihilation interaction between an interstitial and a vacancy. Clusters containtng more than two interstitials are also formed. Previous work in copper is discussed, and it is concluded that this previous work is consistent with the above description of Stage I recovery. The relationship of the present work to the general problem of assigning defect processes to the higher temperature recovery states in copper is also discussed. (auth)
Research Organization:
General Electric Research Lab., Schenectady, N.Y.; General Electric Co., Richland, Wash.
NSA Number:
NSA-13-022746
OSTI ID:
4224913
Journal Information:
Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D, Journal Name: Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D Vol. Vol: 114; ISSN PHRVA
Country of Publication:
Country unknown/Code not available
Language:
English

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