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Title: FLUORESCENT X-RAY SPECTROGRAPHIC ANALYSIS: STUDIES OF LOW-ENERGY K, L, AND M SPECTRAL LINES

Technical Report ·
OSTI ID:4217865

These investigations were undertaken as part of a program to determine the optimum x-ray spectral lines to use for analyzing the wide variety of samples received by the x-ray Laboratory. Theoretical calculations and experimental data derived from these investigations show that longer wavelength spectral lines,> 2A, are very useful for many analytical problems. Because of the low fluorescence yield of the elements of atomic numbers 13 to 22 and the small depth of penetration of their x-ray spectral lines, these elements were originally considered to be insensitive; however, these studies show that the wide dispersion of their spectral lines, coupled with their weak beta lines, permits the use of wide collimation, thus increasing the line intensity. More importantly, the background due to scattered primary radiation is very low in the longwavelength region. The L-series lines are preferable to the shorter wavelength K lines for elements of atomic numbers 42 to 60 when certain types of samples are analyzed. With infinitely thick samples the K lines are more intense (because of the greater depth of sample analyzed), but the line-to-background ratio is higher for the L lines from the same element. The L lines are both more intense and have a higher line-to-background ratio when thin samples (for example ion-exchange membranes) are analyzed. M-series lines show little promise for application in x-ray spectrochemical analysis. However, the M lines can interfere with the determination of longer wavelength K and L lines so that future x-ray spectrographic 2 theta tables should include the M series. (auth)

Research Organization:
Bureau of Mines
NSA Number:
NSA-14-004316
OSTI ID:
4217865
Report Number(s):
BM-RI-5538
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-60
Country of Publication:
Country unknown/Code not available
Language:
English