A MOLECULAR BEAM ION SOURCE FOR HEX ANALYSIS WITH A MASS SPECTROMETER

Technical Report · Wed Nov 18 04:00:00 EST 1959

OSTI ID:4188728

McKnight, J A

The routine use of mass spectrometers for hex analysis in the U.K.A.E.A. has emphasized the two major difficulties of conventional practice. First, the action of hex is to corrode metals, leading to interference with their electrical properties. Secondly, the products of such corrosion interfere with subsequent measurements, causing the effect known as "memory." It has been found that the mass spectrometer ion source is the chief cause of these difficulties, and this report describes a new design of ion source which is the subject of a patent application. By reconstructing the ionizing assembly in a skeletal form the action of hex has been greatly reduced. A unique feature of this sytem is that the sensitivity and resolution properties for hex are unimpaired. Tests have shown that the ion source can have a hex life at least three times as long as that of a conventional ion source used under the same conditions. The memory effect is greatly reduced in magnitude, and can be calibrated, unlike that in a conventional ion source. Practical infomnation is given concerning the construction and operation of the ion source. Suggestions are made toward improving the penformance even further. (auth)

• Research Organization: United Kingdom Atomic Energy Authority. Development and Engineering Group, Capenhurst, Ches., England
• NSA Number: NSA-14-009579
• OSTI ID: 4188728
• Report Number(s): DEGR-57(CA)
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

CORROSION
ENGINEERING AND EQUIPMENT
ION SOURCES
MASS SPECTROMETERS
METALS
OPERATION
PERFORMANCE
PLANNING
RESOLUTION
SENSITIVITY